CompTIA Security+ Exam Cram, 2/e (Paperback)
作者:Diane Barrett, Kirk Hausman, Martin Weiss, 出版社:Que, 出版日期:2009-01-01
定價 1325 元, 最低 812 元起... Amazon、Amazon Canada、Amazon United Kingdom 完整列出比價資訊...
商品條碼:9780789738042, ISBN:078973804X
分類標籤:General » Refinements » Subjects » Books » Computers & Internet
內容簡介
CompTIA簧 Security+ Exam Cram
Second Edition
Exam SY0-201
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Diane Barrett
Kirk Hausman
Martin Weiss
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The Smart Way to Study���
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Covers the critical information you need to know to score higher on your Security+ exam!
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WRITTEN BY LEADING EXPERTS:
Diane Barrett (MCSE, A+, Security+) is a professor in the Network Security and Computer Forensics programs at the University of Advancing Technology. She belongs to several security user groups, including HTCIA and InfraGard.
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Kirk Hausman (MCSE, Security+) has worked for more than 20 years as a consultant, trainer, IT manager, and network and security administrator. He works for Texas A&M University as assistant commandant for IT.
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Martin Weiss (CISSP, Security+, MCSE) is a manager of information security gurus at RSA, the security division of EMC.
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ISBN-13: 978-0-7897-3804-2
ISBN-10: 0-7897-3804-X
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